Image:Fib tem sample.jpg
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SEM micrograph of a wide-bandgap semiconductor prepared for TEM by focused-ion-beam milling.
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- (del) (cur) 12:12, 9 March 2006 . . Cm the p (Talk | contribs) . . 1024×800 (210,246 bytes) (SEM micrograph of a wide-bandgap semiconductor prepared for TEM by focused-ion-beam milling.)
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| Orientation | Normal |
|---|---|
| Horizontal resolution | 100 dpi |
| Vertical resolution | 100 dpi |
| Software used | Adobe Photoshop CS Windows |
| File change date and time | 07:08, 9 March 2006 |
| Color space | 65535 |
