X-ray reflectivity
From Wikipedia, the free encyclopedia
X-ray reflectivity or XRR is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.[1] One of the simplest formulas describing theoretically expected reflectivity from ideally smooth and sharp, structureless interface was derived by Augustin-Jean Fresnel and is known as Fresnel reflectivity.
[edit] Manufacturers of XRR apparatus
- Bede Scientific
- Bruker-AXS
- Panalytical (formerly Philips)
- Rigaku
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[edit] References
- ^ Holy, V. et al. Phys. Rev. B. 47, 15896 (1993).
