Image:Simple-TEM-beam-path.jpg
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[edit] Summary
This is a simple sketch of the beam path of the electrons in a TEM after the illumination system. A Parallel beam of electrons enters the speciemen and are scattered in varius directions. The objective lens is used to collect all scattered beams originating from the same point on the sample in one point in the image plane (bottom). Note also that in the back focal plane (marked 'diffraction pattern') electrons originating at different point on the sample, but scattered in the same direction, are collected. Observing the electrons in this plane gives the diffraction pattern, containing information on the angular scattering distribution of the electrons. The diffraction pattern and the image are related through a Fourier transform.
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I, the creator of this work, hereby grant the permission to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts.
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- (del) (cur) 06:21, 20 October 2005 . . Oysteinp (Talk | contribs) . . 787×653 (103,055 bytes) (This is a simple sketch of the beam path of the electrons in a TEM after the illumination system. A Parallell beam of electrons enters the speciemen and are scattered in varius directions. The objective lens is used to collect all scattered beams originat)
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| Orientation | Normal |
|---|---|
| Horizontal resolution | 200 dpi |
| Vertical resolution | 200 dpi |
| Software used | Adobe Photoshop CS2 Windows |
| File change date and time | 22:27, 19 October 2005 |
| Color space | 65535 |
