RHEED-TRAXS
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RHEED-TRAXS (Reflection High Energy Electron Diffraction - Total-Reflection-Angle X-Ray Spectroscopy) is a technique for monitoring the chemical composition of crystals. RHEED-TRAXS analyzes X-Ray spectral lines emitted from a crystal as a result of electrons from a RHEED gun colliding with the surface.
RHEED-TRAXS is preferential to x-ray microanalysis (XMA) because the incidence angle of the electrons on the surface is very small, typically less than 5°. As a result, the electrons do not penetrate deeply into the crystal, meaning the x-ray emission is restricted to the top of the crystal, allowing for real-time, in-situ monitoring of surface stoichiometry.
The experimental setup is fairly simple. Electrons are fired onto a sample causing x-ray emission. These x-rays are then detected using a silicon-lithium Si-Li crystal placed behind beryllium windows, used to maintain vacuum.
[edit] References
- Hasegawa, Ino, Yamamoto, Daimon, Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)
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