Image:Scanning electron microscope hg.jpg
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| This is a file from the Wikimedia Commons. The description on its description page there is shown below. |
| Description |
Scanning electron microscope (SEM) in the Geological Institute of Kiel University, Germany. Type Cambridge S150, 1980. Middle background is the column producing the electron beam with the sample chamber at the bottom. On the left is an EDAX (energy dispersive analysis of X-rays) for semiquantitative analysis of elements. X-rays are produced by the electron beam in interaction with the sample. |
|---|---|
| Source |
own work |
| Date |
1980-07-07 |
| Author |
Hannes Grobe |
| Permission |
Own work, share alike, attribution required (Creative Commons CC-BY-SA-2.5) |
|
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Metadata
This file contains additional information, probably added from the digital camera or scanner used to create or digitize it. If the file has been modified from its original state, some details may not fully reflect the modified image.
| Camera manufacturer | Nikon |
|---|---|
| Camera model | Nikon SUPER COOLSCAN 4000 ED |
| Orientation | Normal |
| Horizontal resolution | 1000 dpi |
| Vertical resolution | 1000 dpi |
| Software used | Adobe Photoshop 7.0 |
| File change date and time | 21:20, 26 June 2006 |
| Y and C positioning | 1 |
| Exif version | 2.1 |
| Color space | 65535 |
