Scanning electron microscope
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The scanning electron microscope (SEM) is a type of electron microscope capable of producing high-resolution images of a sample surface. Due to the manner in which the image is created, SEM images have a characteristic three-dimensional appearance and are useful for judging the surface structure of the sample.
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[edit] Scanning process
In a typical SEM, electrons are thermionically emitted from a tungsten or lanthanum hexaboride (LaB6) cathode and are accelerated towards an anode; alternatively, electrons can be emitted via field emission (FE). Tungsten is used because it has the highest melting point and lowest vapour pressure of all metals, thereby allowing it to be heated for electron emission. The electron beam, which typically has an energy ranging from a few hundred eV to 50 keV, is focused by one or two condenser lenses into a beam with a very fine focal spot sized 1 nm to 5 nm. The beam passes through pairs of scanning coils in the objective lens, which deflect the beam horizontally and vertically so that it scans in a raster fashion over a rectangular area of the sample surface. When the primary electron beam interacts with the sample, the electrons lose energy by repeated scattering and absorption within a teardrop-shaped volume of the specimen known as the interaction volume, which extends from less than 100 nm to around 5 µm into the surface, The size of the interaction volume depends on the beam accelerating voltage, the atomic number of the specimen and the specimen's density. The energy exchange between the electron beam and the sample results in the emission of electrons and electromagnetic radiation which can be detected to produce an image, as described below.
[edit] Detection of secondary electrons
The most common imaging mode monitors low energy (<50 eV) secondary electrons. Due to their low energy, these electrons originate within a few nanometers from the surface. The electrons are detected by a scintillator-photomultiplier device and the resulting signal is rendered into a two-dimensional intensity distribution that can be viewed and saved as a Digital image. This process relies on a raster-scanned primary beam. The brightness of the signal depends on the number of secondary electrons reaching the detector. If the beam enters the sample perpendicular to the surface, then the activated region is uniform about the axis of the beam and a certain number of electrons "escape" from within the sample. As the angle of incidence increases, the "escape" distance of one side of the beam will decrease, and more secondary electrons will be emitted. Thus steep surfaces and edges tend to be brighter than flat surfaces, which results in images with a well-defined, three-dimensional appearance. Using this technique, resolutions less than 1 nm are possible.
[edit] Detection of backscattered electrons
Backscattered electrons consist of high-energy electrons originating in the electron beam, that are reflected or back-scattered out of the specimen interaction volume. Backscattered electrons may be used to detect contrast between areas with different chemical compositions, especially when the average atomic number of the various regions is different, since the brightness of the BSE image tends to increase with the atomic number.
Backscattered electrons can also be used to form an electron backscatter diffraction (EBSD) image. This image can be used to determine the crystallographic structure of the specimen.
There are fewer backscattered electrons emitted from a sample than secondary electrons. The number of backscattered electrons leaving the sample surface upward might be significantly lower than those that follow trajectories toward the sides. Additionally, in contrast with the case with secondary electrons, the collection efficiency of backscattered electrons cannot be significantly improved by a positive bias common on Everhart-Thornley detectors. This detector positioned on one side of the sample has low collection efficiency for backscattered electrons due to small acceptance angles. The use of a dedicated backscattered electron detector above the sample in a "doughnut" type arrangement, with the electron beam passing through the hole of the doughnut, greatly increases the solid angle of collection and allows for the detection of more backscattered electrons.
[edit] Beam-injection analysis of semiconductors
The nature of the SEM's probe, energetic electrons, makes it uniquely suited to examining the optical and electronic properties of semiconductor materials. The high-energy electrons from the SEM beam will inject charge carriers into the semiconductor. Thus, beam electrons lose energy by promoting electrons from the valence band into the conduction band, leaving behind holes.
In a direct bandgap material, recombination of these electron-hole pairs will result in cathodoluminescence; if the sample contains an internal electric field, such as is present at a p-n junction, the SEM beam injection of carriers will cause electron beam induced current (EBIC) to flow.
Cathodoluminescence and EBIC are referred to as "beam-injection" techniques, and are very powerful probes of the optoelectronic behavior of semiconductors, particularly for studying nanoscale features and defects.
[edit] Cathodoluminescence
Cathodoluminescence, the emission of light when atoms excited by high-energy electrons return to their ground state, is analogous to UV-induced fluorescence, and some materials such as zinc sulphide and some fluorescent dyes, exhibit both phenomena. Cathodoluminescence is most commonly experienced in everyday life as the light emission from the inner surface of the cathode ray tube in television sets and computer CRT monitors. In the SEM, CL detectors either collect all light emitted by the specimen, or can analyse the wavelengths emitted by the specimen and display a spectrum or an image of the cathodoluminescence in real colour.
[edit] X-ray microanalysis
X-rays, which are also produced by the interaction of electrons with the sample, may also be detected in an SEM equipped for energy-dispersive X-ray spectroscopy or wavelength dispersive X-ray spectroscopy.
[edit] Resolution of the SEM
The spatial resolution of the SEM depends on the size of the electron spot which in turn depends on the magnetic electron-optical system which produces the scanning beam. The resolution is also limited by the size of the interaction volume, or the extent to which the material interacts with the electron beam. The spot size and the interaction volume are both very large compared to the distances between atoms, so the resolution of the SEM is not high enough to image down to the atomic scale, as is possible in the transmission electron microscope (TEM). The SEM has compensating advantages, though, including the ability to image a comparatively large area of the specimen; the ability to image bulk materials (not just thin films or foils); and the variety of analytical modes available for measuring the composition and nature of the specimen. Depending on the instrument, the resolution can fall somewhere between less than 1 nm and 20 nm. In general, SEM images are much easier to interpret than TEM images.
[edit] Environmental SEM
Conventional SEM requires samples to be imaged under vacuum, which means that samples that would produce a significant amount of vapour, e.g. biological samples, need to be either dried or cryogenically frozen. This means that process involving transitions to or from liquids or gases, such as the drying of adhesives or melting of alloys, could not be observed.
The development of the Environmental SEM (ESEM) in the late 1980s[1]allowed samples to be observed in low-pressure gaseous environments (e.g. 10-50 Torr) and high humidity (up to 100%). This was made possible by the development of a secondary-electron detector capable of operating in the presence of water vapour and pressure-limiting apertures in the path of the electron beam to separate the vacuum region around the gun and lenses from the sample chamber.
The first ESEMs were produced by the ElectroScan Corporation in USA in 1988 [2]. ElectroScan were later taken over by Philips (now FEI) in 1996 [3].
[edit] See also
[edit] References
- ^ US4720633 (1988-1-19) Alan C. Nelson Scanning electron microscope for visualization of wet samples
- ^ History of Electron Microscopy, 1980s
- ^ History of Electron Microscopy 1990s
[edit] External links
[edit] General
- Notes on the SEM Notes covering all aspects of the SEM
[edit] History
- Microscopy History links from the University of Alabama Department of Biological Sciences
- The Early History and Development of SEM from Cambridge University Engineering Department
- Milestones in the History of Electron Microscopy from the Swiss Federal Institute of Zürich
- Environmental Scanning Electron Microscope (ESEM) history
[edit] Images
- Tescan Image Gallery Some great SEM images of various specimens, as well as analytical results
- Dennis Kunkel Microscopy, Inc. Large collection of SEM images - mostly false colour
- Jeol SEM Images Twelve SEM images of various specimens
- SEM Lab at the Smithsonian National Museum of Natural History; includes a gallery of images
- Rippel Electron Microscope Facility Many dozens of (mostly biological) SEM images from Dartmouth College.
[edit] Gallery of SEM images
The following are examples of images taken using a scanning electron microscope.
 SEM Picture of a Diatom at magnification of 5000X. |
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 SEM image of an ant head. |
 SEM image of asbestos fibers. |
 Compound eye of Antarctic krill Euphausia superba. |
 Ommatidia of Antarctic krill eye. |
 SEM image of a discharged nematocyst. |
 SEM image of the upper body of a Drosophila. |
 SEM images of the compound eye of a Drosophila. |
 SEM image of the grasshopper's spiracle valve. |
 SEM image of normal circulating human blood. |
